Automotive High-Speed Serial: How the Harsh Environment Challenges Established Technology & Test Methods

Event Time

Originally Aired - Wednesday, January 31 3:00 PM - 3:45 PM PST

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Event Location

Location: Ballroom G


Event Information

Title: Automotive High-Speed Serial: How the Harsh Environment Challenges Established Technology & Test Methods

Session proceedings: not yet available for this session.

Type: Technical Session

Description:

The harsh automotive environment includes sudden and prolonged attacks of electromagnetic interference (EMI), dynamic channel response variations caused by thermal and humidity fluctuations – temperature ranges of -40 to +150 C, and humidity variations from frozen to soaked to desiccated – and interconnects composed of multiple cable segments combined with reflection-generating inline connectors that, over years of use, suffer shielding degradation and channel attenuation. The expected lifetime of every component, without loss of signal integrity, is 20+ years and 200,000+ miles. Plus, conventional HSS (High-Speed Serial) equalization and Forward Error Correction (FEC) methods are inadequate for the varying magnitudes and spectra of automotive non-Gaussian, high peak probability, narrowband interference and crosstalk. Managing the signal-to-noise ratio and error rate in this unstable, safety-critical environment demands highly-adaptive serdes that dynamically track channel variations and are capable of some interference cancellation. Our presentation addresses the design, diagnostic, and compliance testing methodologies required to ensure durable, error-free automotive communication links composed of interoperable components through the vehicle lifespan. We'll conclude with a discussion of the requirements of the current HSS automotive standards – MIPI A-PHY, Automotive Ethernet, and ASA – and solicit audience comments on their strengths and weaknesses.

Pass Type: All-Access Pass, 2-Day Conference Pass, Conference and Expo Pass - No Lunch


Categories

Conference Passes

  • 2-Day Conference Pass
  • All-Access Conference Pass
  • Conference and Expo Access
  • Education and Author Passes

Discipline

  • Automotive
  • High-Speed Communications

Education Level

  • All

Primary Track

  • Drive World - Advanced Automotive

Secondary Track

  • 12. Applying Test & Measurement Methodology

Speakers


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